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Update on Pending Major Revisions to ANSI C63.4 and the NEW ANSI C63.25.2
April 28, 2022 @ 8:00 am - 9:30 am
This webinar will provide an update on the NEXT EDITION of ANSI C63.4 (Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz) and the NEW ANSI C63.25.2 (Validation Methods for Radiated Emission Test Sites, 30 MHz to 1 GHz). It is expected these two standards will be published concurrently in early 2023 – attend the webinar to learn why the concurrent publication timing is IMPORTANT.
In addition to our speakers being active technical contributors to the writing of these standards, our moderator is Daniel D. Hoolihan, Chair of ANSC C63 that develops these standards. Mr. Hoolihan is President of Hoolihan EMC Consulting. His 50 years of experience in the EMC engineering profession began at Control Data Corporation. Since January 2000, he has been consulting in EMC engineering. Mr. Hoolihan has been a member of the IEEE since 1983 and is currently a Life Senior Member. From 1998-1999 he was President of the IEEE EMC Society and has served on its Board of Directors for many years since 1987. He has held numerous leadership positions within the EMC Society and currently serves as Chair of the History Committee. Mr. Hoolihan received his MS degree in Physics from Louisiana State University in 1969 and his MBA from the University of Minnesota in 1975.
Speaker(s): Andy Griffin, Zhong Chen
Agenda:
All times shown are Pacific Daylight Time
8:00 am Welcome and Announcements – Mr. Dan Hoolihan, Chair, ANSC C63®
8:05 am Update on ANSI C63.4:202x – Latest Developments By Andy Griffin, EMC Standardization Subject Matter Expert, Cisco Systems, San Jose, California
8:40 am Streamlining Site Validation Measurements Below 1 GHz in C63.25.2 By Zhong Chen, Director of RF Engineering, ETS-Lindgren, Cedar Park, Texas
9:15 am Q&A with the Speakers, moderated by Mr. Hoolihan
9:30 am Wrap Up/Final Comments
Cedar Park, Texas, United States, Virtual: https://events.vtools.ieee.org/m/311708