What you will learn: – EMC processes and typical tools for debugging and pre-compliance – Locating radiated emissions with near-field probes using a spectrum analyzer and oscilloscope – Conducted emissions pre-compliance measurements with a spectrum analyzer and oscilloscope – Live demo: conducted emissions measurement for a DC/DC buck converter Join to learn how to simplify your EMC workflow, reduce development time, and improve confidence before final compliance testing. (https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/FA85AA09331EC7FCA92C2C0BD8F7B69D187A545A?_V_=2&_K11_=B1EDDF6E4D858DB8476997F36177A26AC154A0F3&_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvNTM1NDgwNC82NTQ3Q0VFNTczMTQzQkZEMDE1REE4M0Q5NzJEQTFDOD9wYXJ0bmVycmVmPW1pZF8zNTk4NF9uYV9tNGNpbnZpdGF0aW9uXw&_K13_=845&_K14_=69022d97985314a93516afeeab81bec91f8b2f9f914768bba3ce963da71a4e6b) Co-sponsored by: IEEE North Jersey Section Speaker(s): Pasi Suhonen Virtual: https://events.vtools.ieee.org/m/564810