This event has passed.

Deembedding test fixtures for high-speed digital applications

Name: Deembedding test fixtures for high-speed digital applications
Start: 2023-05-24T10:00:00-04:00
End: 2023-05-24T11:00:00-04:00
Location: Virtual: https://events.vtools.ieee.org/m/362056

May 24, 2023 @ 10:00 am - 11:00 am

This webinar is intended for engineers who work on digital design and testing. Particularly we will be discussing the impact of test fixture de-embedding on digital interface testing.

Co-sponsored by: IEEE North Jersey Section

Speaker(s): Martin Stumpf, Dr. Mathias Hellwig, Fabian Altenbrunn

Virtual: https://events.vtools.ieee.org/m/362056

Details

Date:: May 24, 2023
Time:: 10:00 am - 11:00 am
Event Category:: Region 1
Website:: https://events.vtools.ieee.org/m/362056

Organizer

: fang_luo@stonybrook_edu
Email: fang_luo@stonybrook_edu

Venue

: Virtual: https://events.vtools.ieee.org/m/362056