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Designing Microwave Filters Using Automatic 3D Modelling and AI Optimization
January 27, 2022 @ 6:30 pm - 8:30 pm
Title: Designing Microwave Filters Using Automatic 3D Modelling and AI optimization
5G and mm-Wave application growth is driving the demand for more RF microwave filters. With increasing complexity and rising volume production requirements, improving yield with more consistent RF performance is a major objective for many filter design teams. This trend is pushing the challenge upstream to the design process and forcing filter designers to produce new and better design simulations with even quicker turnaround times. There are two areas of the process that can serve as bottlenecks in the R&D process: the time it takes to create the 3D rendering, and the time it takes to optimize the design and simulation model.
This industry seminar will introduce the accelerated SynMatrix-Ansys workflow for 5G and mmWave microwave filter design. Using several use case examples, this seminar will demonstrate the use of automation workflows that were designed to complete change the way a microwave filter is 3D rendered, analyzed and optimized. The use cases will cover structure types such as coaxial cavities, and rectangular and cylindrical waveguides seen in sub-6 and X/K/Ka/mm-Wave applications.
Speaker: Diamond Liu (XunLiu)
Diamond Liu (XunLiu) is a senior RF/microwave engineer with more than 13 years of design and hands-on experience. He has previous work experience at Spinner Telecommunication, Nokia, Sinclair Technologies, COMDEV (acquired by Honeywell Aerospace), and Zebra Technologies where he led various design projects involving filters, multiplexers, and antenna design to name a few. He was also the founder of SynMatrix360 Technologies (now SynMatrix Technologies Inc.). Diamond holds a masters degree from the University of Saskatchewan where he specialized in the research areas of RF/microwave components, circuits, antenna design, and passive components.
Buffalo, New York, United States, 14221, Virtual: https://events.vtools.ieee.org/m/299181
