History and Future of Measurement Methods in ANSC C63.4
May 5 @ 5:00 pm - 8:30 pm
The []IEEE EMC Boston Chapter is Pleased to Announce a Meeting / Technical Presentation with Special Guests and Speakers from ANSC C63®
History and Future of Measurement Methods in ANSC C63.4
Hosted at:
(https://go.tuv.com/technology-and-innovation-center-boxborough-ma)
Co-Sponsored by:
ETS-Lindgren and Rohde & Schwarz
Co-sponsored by: ETS-Lindgren and Rohde & Schwarz
Speaker(s): Zhong Chen, Nicholas Abbondante, Bob Mitchell, Art Wall
Agenda:
Date: Monday, May 5, 2025
Time: 5:00 pm Registration/check-in, complimentary dinner and refreshments
6:00 pm Welcome from TÜV Rheinland North America and IEEE EMC Boston Chapter
6:10 pm “The History of ANSI C63.4” by Art Wall, former FCC Representative to ANSC C63
6:30 pm “Addressing Under-Testing in EMC Emissions Measurements: A Comparative Analysis of Boresighting and Linear Scanning Methods” by Zhong Chen, ETS-Lindgren
7:00 pm “Don’t Get Tilted” By Nicholas Abbondante, Intertek, Boxborough, MA
7:30 pm Live Demonstrations of Boresight and Linear Scan Methods in 10m Chamber by
Bob Mitchell, TÜV Rheinland
8:15 pm Reconvene in meeting room – Q&A – Closing Comments
8:30 pm Adjourn
See presentation abstracts and speaker bios below.
400 Beaver Brook Road, Boxborough, Massachusetts, United States