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R1 Sponsored: Microelectronic Design and Test Symposium

May 18 @ 8:00 am - May 21 @ 5:00 pm

[NATW 2019][NATW 2019]

Theme – Innovation in Microelectronics for AI, Security, and New Advances in Computing

The 30th IEEE Microelectronics Design & Test Symposium (MDTS, formerly known as NATW) provides an annual world forum for academy and industry researchers and engineers to discuss latest advances in microelectronics, share their visions in modern microelectronic technologies and foster academy-industry collaboration. The four-day symposium will feature keynote and plenary talks, special sessions, tutorials, panel discussions and contributed oral and poster presentations. The MDTS’2021 will be a full virtual event.

Topics of Interest include but are not limited to:

Micro Devices, Circuits and Microsystems: Analog/mixed-signal/RF circuits; Low-power low-voltage design; Sensors and sensing systems; Smart system design for automotive, automation and robotics; Circuits and systems for approximate and evolvable computing; Memristor based devices; Lab-on-Chip, wearable and implantable devices; Heterogeneous integration and multi-scale chiplet-based packaging architecture

Biomedical, Photonics, and Quantum Electronics: Biomedical and bio-inspired circuits and systems; MEMS sensors and bioelectronics; Nanobiophotonics for optical imaging, sensing and diagnostics; Terahertz photonics for communications; Photodetectors, sensors and imaging; Photonics for energy and green photonics

Electronic Design & Test Methodologies and EDA: Electronic design tools, processes and methodologies; EDA for 3D integrations and advanced packaging; EDA for bio-inspired and neuromorphic systems; EDA tools, methodologies and applications for Photonics devices, circuit and system design; SoC/IP testing strategies; Hardware/software co- verification; DFT & BIST for digital designs, analog/mixed-signal IC’s, SoC’s, and memories;Design verification/validation; Machine learning for testing

Hardware Security: Microarchitectural attacks; Side channel attacks and mitigation;
(Anti-)Reverse engineering and physical attacks; Hardware obfuscation; Computer-aided
design for security; System-on-chip security, FPGA and reconfigurable fabric security;
Internet-of-Things and cyber physical system security

Emerging Technologies and Applications: Computing-in-memory architectures; Neural
networks, machine and deep learning; Application of cognitive, neuromorphic and quantum
computing; Next-generation design-technology co-optimization; Advanced interconnect; 3D
manufacturing

The Program Committee invites authors to submit original, unpublished papers, panel and
special session proposals. Regular and special papers are limited to six double-column IEEE
formatted pages. Two-page extended summaries are also welcomed. Accepted papers
presented at the symposium will be included in the MDTS proceedings and will be published
in IEEE Xplore®. Special session proposals must include title, topic abstract, speakers short
bio and a list of contributing papers. All papers must be submitted through the submission
site. For detailed instructions for submission, please refer to mdts.ieee.org.

Jake Karrfalt Best Student Paper Award: To encourage student participation in the testing research community, MTDS has sessions dedicated to student presentations and includes a Best Student Paper Award

Important Dates:

– Manuscript submission: 4/14/2021
– Tutorial, Panel, Special Session: 4/14/2021
– Notification of acceptance: 4/20/2021
– Camera-ready paper: 5/10/2021
– Submission of presentations: 5/14/2021

– Sponsorship
– IEEE Schenectady Section
– IEEE Region 1

[2021 Supporter Application](https://mdts.ieee.org/wp-content/uploads/sites/306/2021/02/2021-MDTS_Corporate_Supporter_Application-v2.doc)

Co-sponsored by: IEEE Schenectady-NY

Albany, New York, United States

Details

Start:
May 18 @ 8:00 am
End:
May 21 @ 5:00 pm
Event Category:
Website:
https://events.vtools.ieee.org/m/268604

Organizer

eatwood@us_ibm_com
Email:
eatwood@us_ibm_com

Venue

Albany, New York, United States
Albany, New York, United States + Google Map

IEEE Region 1 Website