What is my measurement equipment actually doing? Implications for 5G/6G, mm-wave and related applications

Current microwave and high frequency instrumentation perform many tasks behind the scenes, even more so in the mm-wave and high modulation rate regimes, and it is easy to lose track of how the equipment, the processing algorithms, the setup and the signals are interacting. By exploring the measurement mechanics within some common instruments under practical conditions, it may be easier to understand where sensitivities or anomalies might increase and how to mitigate them. Through a study of example architectures and measurements, including those in the 100+ GHz range and those with wide modulation bandwidths where linearity, dynamic range and other physical metrics are stressed even more, mechanisms and ideas for better measurements will be explored.

Speaker(s): IEEE MTT Distinguished Microwave Lecturer Dr. Jon Martens of Anritsu,

Agenda:
5:45pm: Log in to WebEx and wait to be admitted;

6:00pm: Presentation;

7:00pm: Q&A and discussion;

Virtual: https://events.vtools.ieee.org/m/322424