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Room: 414, Bldg: Schapiro-CEPSR

November 2016

Electrostatic Discharge (ESD) Protection in 28-nm CMOS Technology Node and Beyond:

November 11, 2016 @ 11:00 am - 12:00 pm

Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of electronic components. It is an event in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and hence more than 35% of chip damages can be attributed to the ESD event.  As such, designing on-chip ESD…

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