![Loading Events](https://r1.ieee.org/wp-content/plugins/the-events-calendar/src/resources/images/tribe-loading.gif)
- This event has passed.
Rethink 5G testing – how to implement the ultimate 5G device experience for suitable use cases and markets
October 27, 2022 @ 9:00 am - 10:00 am
–
5G changes how we communicate and fuels digital transformation across different industries and vertical markets. True 5G devices strike a balance between having the right feature set and market readiness, ultimately creating value for the end customer.
In this webinar, the following will be discussed:
– Types of 5G devices, markets, and use cases: eMBB, IIoT/RedCap, Fixed Wireless Access, NTN
– Design challenges for the different 5G device markets and use case
– 5G device test strategy to speed up the design
– Please click the link for registration for attending the webinar: [Register](https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/11BD83CEA3BF718727FF51835AF15B632D45E0ED?_V_=2&_K11_=9F8ED169ABB633060368BBA381BCF565B5EDE0E5&_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvMzkyMzMxMS9EQ0YwRkUxMjlDMERCRUZEQzFDMDBGODUxMkZDMjIwQi80MDk1MzY2P3BhcnRuZXJyZWY9bmFfbTRjX1JldGhpbms1R1Rlc3Rpbmc&_K13_=398&_K14_=e429508c4235a621f38b5f6403271c5c21f5d5b6cf1cb16d3c02dd0cd10eeb75)
Co-sponsored by: IEEE North Jersey Section
Speaker(s): Tim Seyler,
Agenda:
– Please click the link for registration for attending the webinar: [Register](https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/11BD83CEA3BF718727FF51835AF15B632D45E0ED?_V_=2&_K11_=9F8ED169ABB633060368BBA381BCF565B5EDE0E5&_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvMzkyMzMxMS9EQ0YwRkUxMjlDMERCRUZEQzFDMDBGODUxMkZDMjIwQi80MDk1MzY2P3BhcnRuZXJyZWY9bmFfbTRjX1JldGhpbms1R1Rlc3Rpbmc&_K13_=398&_K14_=e429508c4235a621f38b5f6403271c5c21f5d5b6cf1cb16d3c02dd0cd10eeb75)
Virtual: https://events.vtools.ieee.org/m/325455