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Hybrid – Adam Bahret Presents…Perfect Accelerated Life Testing!

Bldg: Building 6, ASMPT NEXX, 900 Middlesex Turnpike, Billerica, Massachusetts, United States, 01821, Virtual: https://events.vtools.ieee.org/m/415811

FREE In Person and Virtual Event Measuring the Reliability of new technology is critical for any development team. Accelerated Life Testing (ALT) measures a new product’s life by testing at... Read more →

Hybrid – Radiation Effects in Electronics: Brief Overview and History

Bldg: Main Cafeteria, Lincoln Laboratory, 244 Wood St, Lexington, Massachusetts, United States, 02421, Virtual: https://events.vtools.ieee.org/m/420285

We will begin with a brief overview of radiation effects in electronics, and their effect on reliability. Then we will cover the history of the discovery and our growing awareness... Read more →