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Mastering EVM: Optimizing your test setup
October 18, 2022 @ 14:00 - 15:00
– Wireless standards for 5G FR1/FR2, WiFi 6/7, NewSpace, and future 6G standards are moving to higher frequencies, wider bandwidths, and/or more complex modulation schemes. Test engineers are upgrading their test equipment for R&D, characterization, and production. This webinar explores how to use EVM requirements to define the test instrumentation needs making the most of the budget.
– click the link for registration for attending the webinar: [[REGISTER](https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/0AA8B3B3BA8F4F505B8059AC49F7C31D3D4F878C?_V_=2&_K11_=0B5CB2652215D53B9651F6234F6C73F69F0B08DA&_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvMzk1OTgwNS8yRkI1NTFBMUYzNzIyOEJGNzkxNjc0QzAzRTE5RDI2NC8zNTYxOTIwP3BhcnRuZXJyZWY9bTRjX2ludl8wOTIz&_K13_=398&_K14_=e3409cf50ec8f0cf99e8aa52c4014c8cd5e2fc8e9444fba2ac2401f035f83c26)](https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/11BD83CEA3BF718727FF51835AF15B632D45E0ED?_V_=2&_K11_=9F8ED169ABB633060368BBA381BCF565B5EDE0E5&_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvMzkyMzMxMS9EQ0YwRkUxMjlDMERCRUZEQzFDMDBGODUxMkZDMjIwQi80MDk1MzY2P3BhcnRuZXJyZWY9bmFfbTRjX1JldGhpbms1R1Rlc3Rpbmc&_K13_=398&_K14_=e429508c4235a621f38b5f6403271c5c21f5d5b6cf1cb16d3c02dd0cd10eeb75)
Co-sponsored by: IEEE North Jersey Section
Speaker(s): Martin Lim,
Agenda:
– click the link for registration for attending the webinar: [Rethink 5G testing webinar – register now](https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/11BD83CEA3BF718727FF51835AF15B632D45E0ED?_V_=2&_K11_=9F8ED169ABB633060368BBA381BCF565B5EDE0E5&_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvMzkyMzMxMS9EQ0YwRkUxMjlDMERCRUZEQzFDMDBGODUxMkZDMjIwQi80MDk1MzY2P3BhcnRuZXJyZWY9bmFfbTRjX1JldGhpbms1R1Rlc3Rpbmc&_K13_=398&_K14_=e429508c4235a621f38b5f6403271c5c21f5d5b6cf1cb16d3c02dd0cd10eeb75)[REGISTER](https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/0AA8B3B3BA8F4F505B8059AC49F7C31D3D4F878C?_V_=2&_K11_=0B5CB2652215D53B9651F6234F6C73F69F0B08DA&_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvMzk1OTgwNS8yRkI1NTFBMUYzNzIyOEJGNzkxNjc0QzAzRTE5RDI2NC8zNTYxOTIwP3BhcnRuZXJyZWY9bTRjX2ludl8wOTIz&_K13_=398&_K14_=e3409cf50ec8f0cf99e8aa52c4014c8cd5e2fc8e9444fba2ac2401f035f83c26)
Virtual: https://events.vtools.ieee.org/m/326968